David Paine
Professor:
Engineering
Phone: +1 401 863 1457
Phone 2: +1 401 863 3952
David_Paine@brown.edu
Professor Paine's research interests are in thin film characterization and processing with a focus on interfaces and interface stability in electronic thin film systems. The evolution of microstructure as a function of processing conditions is being studied in a wide range of materials synthesized by techniques such as physical vapor deposition (MBE, dc/rf magnetron sputtering) and low pressure chemical vapor deposition. Key characterization techniques include x-ray diffraction, electron microscopy, in situ reflectivity and in situ resistivity.
Biography
David Paine performs research in the general areas of thin films, interfaces, and electronic materials in the Division of Engineering at Brown University. His interests include oxide electronics, electron microscopy, and physical vapor deposition technology. He serves as Director of the Brown University Electron Microscope Facility and is active in the Materials research society where he has organized symposia on electonic oxides, trasparent conductors, pulse laser deposition, and others.
Interests
Professor Paine's research interests are in thin film characterization and processing with a focus on interfaces and interface stability in electronic thin film systems. The evolution of microstructure as a function of processing conditions is being studied in a wide range of materials synthesized by techniques such as physical vapor deposition (MBE, dc/rf magnetron sputtering) and low pressure chemical vapor deposition. Key characterization techniques include x-ray diffraction, electron microscopy, in situ reflectivity, and in situ resistivity. Examples of recent project topics include novel semiconductor substrate schemes, low temperature deposition of indium tin oxide transparent conductors, high pressure synthesis, and solid phase epitaxy of strained Si1-xGex. One ongoing research project focuses on tin doped indium oxide (ITO), which is a transparent conductor widely used in the fabrication of flat panel displays and in other optoelectronic applications, and the relationship between microstructure and electro-optical performance. A particular interest is the development of microstructure when low substrate temperature, low energy deposition methods are employed. This research has direct application to the fabrication of display devices that utilize low weight polymer substrates and for the deposition of ITO on heat sensitive polymer color filters. Professor Paine and his students are also using ultra high-pressure oxidation for the formation of thermodynamically metastable thin film structures. A high-pressure technique has been demonstrated for the fabrication of Si1-xGexO2 oxides that are compositionally congruent with the underlying Si1-xGex alloy. This technique may find application in the fabrication of Si1-xGex-based MOS devices. In addition, the metastable Si1-xGexO2 oxides created by this technique can be chemically reduced under conditions that yield nano-crystalline Ge. Strategies for the epitaxial growth of low defect density semiconducting materials is another area of active research. Examples include the growth of GaN on lattice matched single crystal Hf substrates, growth of lattice mismatched, and growth on step graded staircase buffer structures. In a related set of of studies, solid phase epitaxial growth on ion-beam amorphized Si1-xGex is being studied to reveal the effect of misfit strain on the kinetics of solid phase epitaxial regrowth.
Awards
N/A
Affiliations
Materials Research Society
Institute of Electrical and Electronics Engineers (IEEE)
The Minerals, Metals and Materials Society (TMS)
Teaching
Prof Paine teaches courss in in the Division of Engineering in materials characterization (EN245: Electron microscopy); in thermodynamics of phase equilibrium (EN141 and EN 241); in electonic materials (EN145); and has taught courses in crystallography, physical metallurgy, and an introductory materials copurse in the core (EN41).
Funded Research
• Roche Diagnostics: $50,000 08/05
• Solaris Nanoscience $45,000, 08/04
• Roche Diagnostics Grant, $30,000, 06/03
• Umicorp Grant, $15,000, 03/03
• Roche Diagnostics Grant, "Microstructure of electrode materials", $24,000 06/01
• Xanthon Inc., "ITO Microstructure and Surface Morphology and Chemistry", $120,000 1/1/00-2/31/01
• Materials Research Science and Engineering Center, co-investigator with 16 colleagues
• Technimet, "Transport measurements in ITO on Polymer", $10,000, 10/01/00 (2'nd of two)
• Roche Diagnostics, " Metallization of polymers", $23,000, 6/1/00
• Kopin, A TEM study of III-V interfaces, $10,000 1/01/00
• DARPA/Materials Systems Inc.,"Solid State Conversion of High Strain Materials for Multilayer Actuators", $60,231.00, 06/01/99-05/31/02
• Ultrafine Powder Technology/RI EPC, "Microstructural Characterization of Nd-Fe-B", $233,542.00, 06/01/99-05/31/01.
• Technimet, "Unrestricted grant for the study of indium oxide on polymer", $10,000.00, 06/01/99-09/01/99
• Martin-Marrietta (P.I.) "Electron microscopy investigation of defect nucleation and propagation in Sb-based buffer layers on GaAs substrates", $15,000.00
• RI Economic Policy Council-Samuel Slater Innovation Partnership Program (P.I. with T. Morse) "High Rate Preparation of Specialty Indium Oxide Powders", $140,000.00
• Arconium Corp.(P.I.) "Thin Film Microstructure Control for Optimum Performance of TCO's", $40,000.00/yr (10k quarterly) 9/96-9/97
• Office of Naval Research, (P.I.) "High Pressure Oxidation of Si1-xGex For Electronic Applications", $47,000/yr, (1992-1995)
• National Science Foundation, (P.I.) "Novel materials synthesis by HPO" $55,0000.00/yr (1991-1994)
• National Science Foundation, (P.I.) $30,000.00, Engineering Research Equipment, Si1-xGex processing equipment (1992)
• National Science Foundation, Materials Research Group, (co-investigator with 10 colleagues) Micro-mechanics of Failure Resistant Materials≈$40,000.00/yr (1990-1993)
• National Science Foundation, Materials Research Group, (co-investigator with 10 colleagues) Micro- and Nano-mechanics of Failure Resistant Materials ≈$44,000.00/yr (1993-1996)
• Toray Industries RICTFIR, Investigation of aluminum/polymer interfaces (co-investigator with 4 collegues) $47,774.00 (1992/93 and 1993/94)
• ASAHI Glass Co., $30,000.00 Research Gift Award, (P.I.)
• Arconium Corp. (Cookson America), Nov. 1993 $10,000.00 Research Gift award, (P.I.)
• Office of Naval Research, Thin films and Interfaces, Associate Investigator, (L.B. Freund, Principal Investigator)
• Department of Energy, SBIR, High Dose Ge Ion Implantation, $50,000 with Ibis Technologies (start Nov. 1993)
• Oak Ridge Associated Universities, (P.I.)$2,000.00/yr, Funded '89, '90, '91, and '92 under the SHaRE program
• International Business Machines,$3,000.00, RICTFIR, '91-93 Enhancement for the study of high pressure processing of Si1-xGex
