Full Two-Dimensional Markov Chain Analysis of Thermal Soft Errors in Subthreshold Nanoscale CMOS Devices

TitleFull Two-Dimensional Markov Chain Analysis of Thermal Soft Errors in Subthreshold Nanoscale CMOS Devices
Publication TypeJournal Article
Year of Publication2011
AuthorsJannaty, P., F. C. Sabou, I. R. Bahar, J. Mundy, W. Patterson, and A. Zaslavsky
JournalIEEE Transactions on Device and Materials Reliability
Volume11
Pagination50-59
Date PublishedMarch