Shot-Noise-Induced Failure in Nanoscale Flip-Flops

TitleShot-Noise-Induced Failure in Nanoscale Flip-Flops
Publication TypeJournal Article
Year of Publication2012
AuthorsJannaty, P., F. C. Sabou, S. T. Le, M. Donato, I. R. Bahar, W. Patterson, J. Mundy, and A. Zaslavsky
JournalIEEE Transactions on Electron Devices
Volume59
Pagination800-806
Date PublishedMarch