Using Implications to Choose Tests Through Suspect Fault Identification

TitleUsing Implications to Choose Tests Through Suspect Fault Identification
Publication TypeJournal Article
Year of Publication2013
AuthorsDworak, J., K. Nepal, N. Alves, Y. Shi, N. Imbriglia, and I. R. Bahar
JournalACM Transactions on Design Automation of Electronic Systems (TODAES)
Volume18
Pagination14:1-14:19